A Machine Learning Based Approach to Detect Machine Learning Design Patterns, accepted for APSEC 2023 ERA track

Weitao Pan, Hironori Washizaki, Nobukazu Yoshioka, Yoshiaki Fukazawa, Foutse Khomh, Yann-Gaël Guéhéneuc, “A Machine Learning Based Approach to Detect Machine Learning Design Patterns,” 30th Asia-Pacific Software Engineering Conference (APSEC 2023), ERA track, Seoul, Korea, Dec 4-7, 2023.