Susumu Tokumoto, Kazunori Sakamoto, Kiyofumi Shimojo, Tadahiro Uehara and Hironori Washizaki, “Semi-automatic Incompatibility Localization for Re-engineered Industrial Software,” Proceedings of the 7th IEEE International Conference on Software Testing, Verification and Validation (ICST 2014), pp.XX-YY, Cleveland, March 31-April 4, 2014. (to appear) https://sites.google.com/site/icst2014/home