Zhenxiang Chen, Hironori Washizaki and Yoshiaki Fukazawa, “Automated Tool for Revising Masking MC/DC Test Suite,” The 31st International Symposium on Software Reliability Engineering (ISSRE 2020), Fast Abstract track, Oct 12 – 15, 2020.
Zhenxiang Chen, Hironori Washizaki and Yoshiaki Fukazawa, “Automated Tool for Revising Masking MC/DC Test Suite,” The 31st International Symposium on Software Reliability Engineering (ISSRE 2020), Fast Abstract track, Oct 12 – 15, 2020.