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Future Advanced Testing Technology Workshop (FATTW 2024, AI/LLM and testing) at Makuhari, Japan was successfully over

Future Advanced Testing Technology Workshop (FATTW 2024, AI/LLM and testing) at Makuhari, Japan was successfully over! It attracted around 100 attendees. Thanks to all the supporters, distinguished speakers (Abdulmotaleb El Saddik, Masashi Sugiyama, Fumio Machida, Hiroshi Maruyama, Shervin Shirmohammadi, San Murugesan, Naoyasu Ubayashi, Jianjun Zhao, Lei Ma, Daisuke Shimbara, Hussein Al Osman, Shogo Tokui, Fuyuki Ishikawa, Shaukat Ali and panel chairs Hironori Takeuchi) , and attendees; it was inspiring and incredible! Let’s keep connected, and see you soon next time!

Opening slide deck titled “IEEE Software Testing Technology Development Trend” at FATTW 2024 is available here.

AI-Pattern’24 co-located with IEEE ISSRE was successfully over!

Thanks to the guest speaker Dr. Qinghua (her talk was so comprehensive to grasp the landscape of Reliable AI, LLM and patterns, practices, governance and assessment) and paper authors, all organizers, supporters, and attendees, AI-Pattern’24: 1st International Workshop on Patterns and Practices of Reliable AI Engineering and Governance co-located with IEEE ISSRE was successfully over! The workshop attracted around 25-30 attendes at peak. The opening slides with the voting results during the discussion are available here. Thank you all, and see you next time!

IEEE-CS SWEBOK Guide V4 is finally out!

IEEE-CS SWEBOK Guide V4 is finally out! Congrats and thank all editors, reviewers, and volunteers for your contributions! The Webinar series on SWEBOK Guide V4 introduction is ongoing; join us and discover latest of BOK in software engineering.