Deep Cross-Project Software Reliability Growth Model using Project Similarity Based Clustering, accepted for Mathematics (SCIE, IF=2.258)

Kyawt Kyawt San, Hironori Washizaki, Yoshiaki Fukazawa, Kiyoshi Honda, Masahiro Taga, Akira Matsuzaki, “Deep Cross-Project Software Reliability Growth Model using Project Similarity Based Clustering,” Mathematics, Special Issue on Mathematics in Software Reliability and Quality Assurance, pp. 1-23, 2021. (SCIE, IF=2.258)